Master’s in SiC/GaN Power Electronics for e-Mobility
Online master's programme of 1,900 hours in SiC/GaN power electronics for e-mobility, structured in 12 modules covering wide-bandgap devices, loss characterisation, gate drives, power stage design, topologies, thermal management, digital control, EMC, reliability and vehicle integration, with an assigned technical tutor.
Take the controls.
Run a real engineering trade-off from this field. Move the sliders, watch the model react in real time and beat the challenge.
What you will be able to do
Compare the properties of SiC and GaN semiconductors with silicon.
Characterise conduction and switching losses using the double-pulse test.
Design gate drive circuits for fast switching.
Select converter topologies for traction and charging.
Size the thermal management of power modules.
Mitigate EMC problems in high-speed switching converters.
Plan reliability qualification in accordance with AQG 324 and AEC-Q101.
Who it's for
- Power electronics engineers moving to SiC and GaN devices.
- Inverter design engineers in electric vehicle programmes.
- Wide-bandgap semiconductor engineers working on applications.
- Electromagnetic compatibility engineers dealing with fast-switching converters.
- Power module reliability engineers.
- Digital control engineers for power converters.
- Engineering or science graduates aiming to enter the automotive industry.
What you'll work with
- AQG 324 (qualification of power modules for automotive use)
- AEC-Q101 (qualification of discrete semiconductors)
- CISPR 25 (radio emissions from vehicle components)
- JEDEC JESD22-A108 (high-temperature operating life)
- IEC 60664-1 (insulation coordination)
- ISO 16750 (environmental conditions for vehicle electrical equipment)
- ISO 26262 (automotive functional safety)
- UN R10 (electromagnetic compatibility of vehicles)
- PLECS
- LTspice
- Ansys Q3D Extractor
- Ansys Icepak
- MATLAB/Simulink
12 modules · 1900 h
1.1Properties of SiC and GaN1.2Comparison with silicon1.3Voltage, temperature and frequency limits1.4MOSFET and HEMT structures1.5Reliability and degradation modes1.6Availability and cost1.7Specific packages1.8Selection by application1.9Datasheet: critical reading1.10Workshop: device comparison
2.1Conduction and switching losses2.2Measurement of fast waveforms2.3Probes and required bandwidth2.4Double-pulse testing and its set-up2.5Switching energies2.6Effect of temperature2.7Device parasitic capacitances2.8Comparison between manufacturers2.9Models for simulation2.10Laboratory: double-pulse test
3.1Driver requirements for SiC and GaN3.2Gate voltages and margins3.3Gate resistors and trade-offs3.4Driver isolation3.5dv/dt immunity3.6Desaturation protection3.7Soft turn-off under fault3.8Driver power supply3.9Physical layout of the driver3.10Laboratory: design and testing of a driver
4.1Parasitic inductances of the switching loop4.2PCB and busbar design4.3Decoupling capacitors4.4Device placement4.5Overvoltage measurement4.6Snubbers and their cost4.7Paralleling of devices4.8Current sharing4.9Design verification4.10Laboratory: loop optimisation
5.1Three-phase traction inverter5.2High-power DC-DC converters5.3On-board chargers5.4Multilevel topologies5.5Resonant converters5.6Selection according to bus voltage5.7Achievable efficiency5.8Power density5.9Comparison of architectures5.10Laboratory: topology simulation
6.1Thermal resistances and paths6.2Ceramic substrates and packaging6.3Direct and indirect cooling6.4Thermal cycling and solder fatigue6.5Junction temperature measurement6.6Compact thermal modelling6.7Derating and design limits6.8Thermal interface materials6.9Thermal validation6.10Laboratory: thermal measurement of a module
7.1PWM modulation and its resolution7.2Current and voltage loops7.3Synchronous sampling and delays7.4Microcontrollers and FPGAs7.5Protections implemented in software7.6Compensation and stability7.7Development tools7.8Control validation7.9Functional safety of the control7.10Laboratory: implementation of a loop
8.1Spectrum generated by fast switching8.2Common mode and parasitic currents8.3Filtering and shielding8.4Designing for EMC from the outset8.5Emissions measurement8.6Common fixes and their cost8.7Speed versus noise trade-off8.8Applicable regulations8.9Pre-certification testing8.10Laboratory: emissions measurement
9.1Failure modes of SiC and GaN9.2AEC-Q qualification tests9.3Accelerated life tests9.4Humidity and bias9.5Cosmic rays and random failures9.6Degradation detection9.7Design for reliability9.8Warranties and field data9.9Failure analysis9.10Case study: qualification plan
10.1Cost per ampere and per watt10.2Price trends10.3Availability and second sources10.4Design for substitutability10.5Impact of packaging on cost10.6Volume and negotiation10.7Supply risks10.8Choosing between silicon and wide-bandgap10.9Business case10.10Workshop: total cost analysis
11.1Location of the converter11.2Power and control connections11.3Shared cooling11.4Audible noise and vibration11.5Maintenance and diagnostics11.6High-voltage safety11.7In-vehicle testing11.8Validation under real conditions11.9After-sales and spare parts11.10Case study: integration of an inverter
12.1Specification and requirements12.2Selection of devices and topology12.3Design of the driver and power stage12.4Thermal and mechanical design12.5Digital control and protections12.6Test and EMC plan12.7Results and measured efficiency12.8Cost and reliability analysis12.9Technical report and defence12.10Master's Thesis: final review with the tutor
How you'll learn
100% online training on the SEIUM campus, with downloadable material, recorded classes and an assigned technical tutor. There are no fixed timetables: you progress at your own pace within each intake, so the programme can be combined with work.
Each module combines theory, guided reading of the original standard and applied exercises. The working software is PLECS, LTspice, Ansys Q3D Extractor, Ansys Icepak and MATLAB/Simulink, in free, academic or evaluation versions. Testing is studied through real procedures: double-pulse testing, switching loss characterisation and electromagnetic compatibility measurements on converters. Assessment is continuous by module, plus the final Master's Thesis.
Standards covered: AQG 324, AEC-Q101, CISPR 25, JEDEC JESD22-A108, IEC 60664-1, ISO 16750, ISO 26262 and UN R10.
Build it end to end
Your final project follows the real engineering workflow, step by step, reviewed by your tutor.
Where this takes you
Requirements
- University degree in engineering, science or architecture, or equivalent demonstrable professional experience.
- Internet connection and a computer capable of running the programme software.
- English sufficient to read technical standards.
Ready to start?
Send your application today. Our admissions team replies within 72 hours with your study plan and funding options.
Frequently asked questions
The programme totals 1,900 hours over 12–14 months. You set your own pace within each intake, and your tutor helps you plan the workload around your job.
You work with PLECS, LTspice, Ansys Q3D Extractor, Ansys Icepak and MATLAB/Simulink, using free, academic or evaluation versions. Your tutor indicates the free alternative wherever one exists.
A SEIUM Institute diploma, awarded on passing the continuous assessment and the Master's Thesis. It is SEIUM's own qualification, not an official state degree; its recognition depends on the programme completed and the regulations of each country.
Yes. Modules passed in a course or postgraduate diploma in the same area are recognised in the higher programme. Ask about the recognition policy when you enrol.
A university degree in engineering, science or architecture (or equivalent professional experience), a computer able to run the software and English sufficient to read technical standards.
Start dates are set by SEIUM's faculty for each intake. Our admissions team will confirm the next available date when you apply.
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