Diploma in Rad-Hard Components and Test Campaigns
Online postgraduate diploma of 800 hours in rad-hard components and test campaigns: 8 modules covering space-grade EEE parts, hardened technologies, COTS in NewSpace, test facilities, TID and SEE testing and data analysis, with an assigned technical tutor.
Take the controls.
Run a real engineering trade-off from this field. Move the sliders, watch the model react in real time and beat the challenge.
What you will be able to do
Classify EEE components according to their space quality level.
Compare hardened technologies with commercial components.
Manage the selection and procurement of components for missions.
Select suitable radiation test facilities.
Design TID and SEE test campaigns.
Analyse test data and derive design parameters.
Document the radiation acceptance of components.
Who it's for
- EEE components engineers
- Radiation test engineers
- Space component procurement managers
- Product assurance engineers
- Reliability engineers
- Space electronics engineers
- Engineering or science graduates looking to enter the space sector
What you'll work with
- ECSS-Q-ST-60C (EEE components for space)
- ECSS-Q-ST-60-15C (radiation hardness assurance for EEE components)
- ESCC 22900 (total dose steady-state irradiation test method)
- ESCC 25100 (single-event effects test method)
- MIL-PRF-38535 (integrated circuit manufacturing)
- MIL-STD-883 (test methods for microcircuits)
- JESD57 (heavy-ion single-event effects testing)
- ASTM F1192 (heavy-ion SEP test guide)
- OMERE
- SPENVIS
- SRIM
- LabVIEW
- Python
8 modules
1.1Space quality classes1.2The ESCC system1.3QML-V and QML-Q lists1.4Preferred parts list1.5Screening and burn-in1.6Construction analysis1.7Automotive-grade components1.8Counterfeits and traceability1.9Obsolescence1.10Workshop: parts list for a subsystem
2.1Silicon on insulator2.2Radiation hardening by design (RHBD)2.3Hardened processes2.4Hardened memories2.5Radiation-tolerant FPGAs2.6Space processors2.7Rad-hard converters and regulators2.8Space packaging2.9Manufacturers and roadmaps2.10Practical exercise: comparing memories for a data recorder
3.1COTS risks3.2Lot-to-lot variability3.3Screening strategies3.4Lot testing3.5Use in short-lifetime missions3.6System-level mitigation3.7Risk-acceptance approaches3.8Success and failure cases3.9Applicable regulations3.10Case study: acceptance of a COTS microcontroller
4.1Cobalt-60 sources4.2Proton accelerators4.3Heavy-ion cyclotrons4.4Neutron sources4.5Pulsed-laser testing4.6Microbeams4.7Beam dosimetry4.8European reference facilities4.9Logistics and costs4.10Practical exercise: selecting a facility for an SEE test
5.1Test plan according to ESCC 229005.2Dose rate and biasing5.3Samples and controls5.4Parametric measurements5.5Annealing and accelerated ageing5.6Low-dose-rate testing5.7Acceptance criteria5.8Test reports5.9Common errors5.10Laboratory: data analysis of a TID test
6.1Test plan according to ESCC 251006.2Sample preparation and decapsulation6.3Selection of ions and energies6.4Test and monitoring systems6.5Latch-up detection6.6Destructive testing of MOSFETs6.7Testing of memories and FPGAs6.8Proton testing6.9Safety at the facility6.10Practical exercise: design of an SEE test bench
7.1Weibull fitting7.2LET threshold and saturation cross-section7.3Statistical uncertainty7.4Calculation of in-orbit rates7.5Comparison with databases7.6Acceptance justification7.7RHA documentation7.8Test databases7.9Communication with the customer7.10Case study: acceptance report for a component
8.1Component selection8.2Radiation requirements8.3TID test plan8.4SEE test plan8.5Facility selection8.6Expected data analysis8.7Budget and schedule8.8Conclusions8.9Report and presentation8.10Final project: final review with the tutor
How you'll learn
A 100% online programme on the SEIUM campus, with downloadable material, recorded classes and an assigned technical tutor. There are no fixed timetables: you progress at your own pace within each intake, so it fits around your job.
Each module combines theory, guided reading of the original standard and applied exercises. You work with OMERE, SPENVIS, SRIM, LabVIEW and Python in free, academic or evaluation versions. Testing is studied through real procedures: designing TID and SEE test campaigns, analysing test data with Weibull fitting and selecting components for NewSpace missions. Assessment is continuous by module, plus the final project.
Standards covered: ECSS-Q-ST-60C, ECSS-Q-ST-60-15C, ESCC 22900, ESCC 25100, MIL-PRF-38535, MIL-STD-883, JESD57, ASTM F1192.
Build it end to end
Your final project follows the real engineering workflow, step by step, reviewed by your tutor.
Where this takes you
Requirements
- Prior technical training or professional experience in the sector. No university degree is required.
- An internet connection and a computer capable of running the programme software.
- English sufficient to read technical standards.
Ready to start?
Send your application today. Our admissions team replies within 72 hours with your study plan and funding options.
Frequently asked questions
The programme totals 800 hours over 6–8 months. You set your own pace within each intake, and your tutor helps you plan the workload around your job.
You work with OMERE, SPENVIS, SRIM, LabVIEW and Python, using free, academic or evaluation versions. Your tutor indicates the free alternative wherever one exists.
A SEIUM Institute diploma, awarded on passing the continuous assessment and the final project. It is SEIUM's own qualification, not an official state degree; its recognition depends on the programme completed and the regulations of each country.
Yes. Modules passed are recognised in a higher programme in the same area (postgraduate diploma or master's). Ask about the recognition policy when you enrol.
Prior technical training or professional experience in the sector (no university degree required), a computer able to run the software and English sufficient to read technical standards.
Start dates are set by SEIUM's faculty for each intake. Our admissions team will confirm the next available date when you apply.
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