Diploma in Validation with TDR/VNA and Correlation
Online postgraduate diploma of 800 hours in TDR/VNA validation and correlation. 8 modules covering time-domain measurement, VNA calibration, de-embedding, S-parameter quality, simulation-measurement correlation and measurement uncertainty, with an assigned technical tutor.
Take the controls.
Run a real engineering trade-off from this field. Move the sliders, watch the model react in real time and beat the challenge.
What you will be able to do
Interpret time-domain impedance measurements with TDR.
Set up and operate multiport vector network analysers.
Calibrate the VNA using SOLT, TRL and electronic methods.
Remove fixture effects using de-embedding techniques.
Verify S-parameter quality according to IEEE 370.
Correlate electromagnetic simulations with measurements.
Estimate measurement uncertainty in the laboratory.
Who it's for
- Signal integrity engineers moving into hands-on measurement and validation.
- RF laboratory engineers looking to master VNA calibration and de-embedding.
- Hardware validation engineers responsible for high-speed interconnects.
- Electronic metrology technicians working with S-parameters and uncertainty budgets.
- Interconnect test engineers in PCB, connector and cable manufacturing.
- Electromagnetic modelling engineers who need to correlate models with real measurements.
- Engineering or science graduates seeking to enter the semiconductor industry.
What you'll work with
- IEEE 370-2020 (electrical characterisation of interconnects and fixtures)
- IPC-TM-650 2.5.5.7 (TDR characteristic impedance testing)
- ISO/IEC 17025:2017 (competence of testing and calibration laboratories)
- Touchstone 2.0 (IBIS Open Forum S-parameter file format)
- EA-4/02 M:2022 (evaluation of measurement uncertainty in calibration)
- IEEE 802.3-2022 (Ethernet channel specifications)
- Keysight PLTS
- scikit-rf
- MATLAB RF Toolbox
- Keysight ADS
8 modules
1.1TDR and TDT principles1.2Rise time and spatial resolution1.3Interpreting impedance profiles1.4Multiple reflections and masking1.5TDR measurement of differential pairs1.6Impedance coupons according to IPC-TM-6501.7Errors due to probes and cables1.8Sampling oscilloscopes1.9Comparison between TDR and VNA1.10Lab: impedance profile of a board with TDR
2.1Architecture of a VNA2.2Two-port and four-port S-parameters2.3Mixed-mode parameters2.4Dynamic range and IF bandwidth2.5Trace noise and averaging2.6Care of precision connectors and adapters2.7RF fixtures and probes2.8Measuring active and passive devices2.9The Touchstone format and version 2.02.10Practical exercise: measuring a four-port differential channel
3.112-term error model3.2SOLT calibration and its limitations3.3TRL and multiline TRL calibration3.4Electronic calibration (ECal)3.5Calibration kits and definitions3.6Calibration verification3.7Drift and stability3.8Reference plane and port extension3.9On-probe and on-board calibration3.10Workshop: TRL calibration with on-board standards
4.1The need for de-embedding4.22x-thru and 1x-reflect methods4.3Fixture modelling according to IEEE 3704.4Fixture quality checks4.5AFR and manufacturer tools4.6Time-domain gating4.7De-embedding errors and their impact4.8PCB test structures4.9Validating extracted models4.10Lab: 2x-thru de-embedding of a connector
5.1Causality, passivity and reciprocity5.2IEEE 370 quality metrics5.3Extrapolation to DC and high frequency5.4Transformation to the time domain5.5Impulse and step response5.6Cascading and concatenating networks5.7Conversion to mixed modes5.8Processing with scikit-rf5.9Detecting resonances and artefacts5.10Practical exercise: causality validation with scikit-rf
6.1Correlation criteria and metrics6.2Comparing insertion and return loss6.3TDR impedance correlation6.4Extracting material Dk and Df6.5Copper roughness fitting6.6Sensitivity to manufacturing tolerances6.7Feature Selective Validation (FSV)6.8Iterating the electromagnetic model6.9Correlation report6.10Case study: correlation of a backplane
7.1Sources of uncertainty in VNA measurements7.2Uncertainty budget according to EA-4/027.3Repeatability and reproducibility7.4Traceability of standards7.5ISO/IEC 17025 requirements7.6Maintenance of kits and connectors7.7Measurement automation with SCPI7.8Measurement data management7.9ESD safety in the laboratory7.10Practical exercise: uncertainty budget for a measurement
8.1Measurement plan and test structures8.2Calibration and verification8.3TDR and VNA measurements8.4Fixture de-embedding8.5Data quality control8.6Correlation with simulation8.7Uncertainty report8.8Design recommendations8.9Report and presentation8.10Final project: final review with your tutor
How you'll learn
Training is 100% online on the SEIUM campus, with downloadable materials, recorded classes and an assigned technical tutor. There are no fixed timetables: you progress at your own pace within the intake, making it compatible with work.
Each module combines theory, guided reading of the original standard and applied exercises. The working software is Keysight PLTS, scikit-rf, MATLAB RF Toolbox and Keysight ADS, in free, academic or evaluation versions. Tests are studied on real procedures for S-parameter measurements with a four-port VNA, TDR impedance profiles and correlation between electromagnetic simulation and measurement. Assessment is continuous by module plus the final project.
Standards covered: IEEE 370-2020, IPC-TM-650 2.5.5.7, ISO/IEC 17025:2017, Touchstone 2.0 (IBIS Open Forum), EA-4/02 M:2022, IEEE 802.3-2022.
Build it end to end
Your final project follows the real engineering workflow, step by step, reviewed by your tutor.
Where this takes you
Requirements
- Prior technical training or professional experience in the sector. No university degree is required.
- Internet connection and a computer able to run the programme software.
- English sufficient to read technical standards.
Ready to start?
Send your application today. Our admissions team replies within 72 hours with your study plan and funding options.
Frequently asked questions
The programme totals 800 hours over 6–8 months. You set your own pace within each intake, and your tutor helps you plan the workload around your job.
You work with Keysight PLTS, scikit-rf, MATLAB RF Toolbox and Keysight ADS, using free, academic or evaluation versions. Your tutor indicates the free alternative wherever one exists.
A SEIUM Institute diploma, awarded on passing the continuous assessment and the final project. It is SEIUM's own qualification, not an official state degree; its recognition depends on the programme completed and the regulations of each country.
Yes. Modules passed are recognised in a higher programme in the same area (postgraduate diploma or master's). Ask about the recognition policy when you enrol.
Prior technical training or professional experience in the sector (no university degree required), a computer able to run the software and English sufficient to read technical standards.
Start dates are set by SEIUM's faculty for each intake. Our admissions team will confirm the next available date when you apply.
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